The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Jun. 26, 2012
Guy M. Besson, Danvers, MA (US);
Guy M. Besson, Danvers, MA (US);
Analogic Corporation, Peabody, MA (US);
Abstract
Among other things, one or more techniques and/or systems are described for dynamically adjusting one or more X-ray acquisition parameters of an X-ray imaging modality. During a first portion of an examination of an object, the object is examined using a first set of X-ray acquisition parameters and a first image is generated. A region-of-interest is identified in the first image and one or more X-ray acquisition parameters are adjusted as a function of the identified region-of-interest to establish a second set of X-ray acquisition parameters. During a second portion of the examination of the object, the object is examined using the second set of X-ray acquisition parameters to generate a second image. In this way, X-ray acquisition parameters can be adjusted in real-time or 'on the fly' to obtain a (more) desired image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile