The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Mar. 15, 2013
Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi-ken, JP;
Hitoshi Fujino, Tajimi, JP;
Yoshifumi Nakamura, Nagoya, JP;
Brother Kogyo Kabushiki Kaisha, Nagoya-Shi, Aichi-Ken, JP;
Abstract
An optical scanner is configured such that an anamorphic condensing lens in an incident optical system has a diffractive lens structure at least in one lens surface thereof, and a length of an optical path increased by the diffractive lens structure φ [rad] is defined by an equation below by a function of height h from an optical axis: φ(h)=M(P·h+P·h+ . . . ), where Pn is a coefficient of an nth-order term of the height h (n is an even number), and M is a diffraction order, that the lens satisfies the following relations: −216≦P≦−49, 1100≦P·(hm max)/(fm·NAm)≦3800, and 10≦fm≦35, where hmmax [mm] is an effective diameter in the main scanning direction, fm [mm] is a focal length in the main scanning direction, and NAm is a numerical aperture in the main scanning direction, and that a wavefront aberration WFE[λrms] in a first wavelength λ[nm] satisfies the following relation: WFE≦0.01.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile