The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2014

Filed:

Mar. 15, 2013
Applicants:

Nathan Bluzer, Rockville, MD (US);

Bron R. Frias, Catonsville, MD (US);

Paul A. Tittel, Columbia, MD (US);

Inventors:

Nathan Bluzer, Rockville, MD (US);

Bron R. Frias, Catonsville, MD (US);

Paul A. Tittel, Columbia, MD (US);

Assignee:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01); H04N 1/60 (2006.01); H04N 1/024 (2006.01); G01D 18/00 (2006.01); G06K 9/20 (2006.01); H04N 5/217 (2011.01); G01C 19/00 (2013.01);
U.S. Cl.
CPC ...
Abstract

A scanning focal plane sensor and method are described for image capturing of object space (or scenes). In one example, a focal plane sensor for a scanning imaging system is provided. The focal plane sensor for a scanning imaging system includes M×N Time Delay Integration (TDI) imaging Charge Coupled Device (CCD), where M is a number of TDI columns and N is a number of TDI stages per each column. A detector is connected to each TDI stage. The focal plane sensor includes an imaging controller configured to mechanize sampling the brightness value of each sensor pixel's initial footprint in object space and select a number of charge integrating TDI stages for substantially equalizing the inter sensor pixels' signal to noise ratios.


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