The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Nov. 02, 2012
Martin Maltz, Rochester, NY (US);
Alvaro E. Gil, Rochester, NY (US);
Himanshu J. Madhu, Webster, NY (US);
Lina Fu, Fairport, NY (US);
J. Michael Sanchez, Rochester, NY (US);
Martin Maltz, Rochester, NY (US);
Alvaro E. Gil, Rochester, NY (US);
Himanshu J. Madhu, Webster, NY (US);
Lina Fu, Fairport, NY (US);
J. Michael Sanchez, Rochester, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A method for processing black point compensation parameters for a color image to be printed so as to enhance image quality of the color image is provided. The method includes analyzing image content of a received color image to identify one or more performance attributes to be considered during a black point compensation parameters processing procedure, the performance attributes estimate an effect of the black point compensation parameters on the image quality of the received color image; selecting, based on the identified performance attributes, a black point compensation (BPC) algorithm to be used during the processing procedure; deriving a model using the identified performance attribute that is configured to estimate relationships between the black point compensation parameters and the identified performance attribute; maximizing the performance attribute of the derived model so as to process the BPC parameters for the color image; and using the processed black point compensation parameters to construct output device profiles.