The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Sep. 27, 2012
Alfredo Castillo, San Jose, CA (US);
Umakaran Nemallan, Cupertino, CA (US);
Alfredo Castillo, San Jose, CA (US);
Umakaran Nemallan, Cupertino, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Alignment of two surfaces of two objects in a manufacturing process is achieved by determining a best fit orientation of the two objects with respect to each other using captured images reflected from the two surfaces. An image pattern is projected on a surface of each object, and a reflected image pattern is captured from the surface of each object. A reconstructed surface is determined from the captured reflected image patterns, and the two reconstructed surfaces are superimposed to determine a best fit orientation of the two objects with respect to each other. One or more movable portions of a base are actuated to align the two surfaces to each other to achieve the determined best fit orientation.