The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Feb. 19, 2009
Applicants:
Rudolf Kessler, Reutlingen, DE;
Tobias Merz, Thun, CH;
Karsten Rebner, Leinfelden, DE;
Inventors:
Assignee:
Hochschule Reutlingen, Reutlingen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01); G01N 21/45 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 21/31 (2013.01);
Abstract
The present invention relates to a method for analyzing chromosomes through preparing a chromosome preparation, measuring at least one interference characteristic of the chromosome preparation and characterizing at least one chromosome structure by way of the interference characteristic. Also, the invention relates to the use of a near-field microscope for analyzing un-dyed chromosomes.