The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2014

Filed:

Oct. 01, 2009
Applicants:

Jing Tang, Menlo Park, CA (US);

Wei Wu, Palo Alto, CA (US);

Qiangfei Xia, Palo Alto, CA (US);

Inventors:

Jing Tang, Menlo Park, CA (US);

Wei Wu, Palo Alto, CA (US);

Qiangfei Xia, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention are directed to systems for performing surface-enhanced Raman spectroscopy. In one embodiment, a system for performing Raman spectroscopy includes a waveguide layer configured with at least one array of features, and a material disposed on at least a portion of the features. Each array of features and the waveguide layer are configured to provide guided-mode resonance for at least one wavelength of electromagnetic radiation. The electromagnetic radiation produces enhanced Raman scattered light from analyte molecules located on or in proximity to the material.


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