The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Oct. 30, 2012
Applicant:
Cheng-shiun Wu, New Taipei, TW;
Inventor:
Cheng-Shiun Wu, New Taipei, TW;
Assignee:
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); G03F 7/20 (2006.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G03F 7/706 (2013.01); G01M 11/0235 (2013.01);
Abstract
An inspecting system for inspecting a lens module includes an inspection device; and a transmitting and loading device. The transmitting and loading device includes a grasping assembly, a supporting assembly, a sliding assembly loaded on the supporting assembly, and a control unit for controlling the grasping assembly and the sliding assembly. The grasping assembly is configured to clamp the lens module and to load the lens module on the sliding assembly, and the sliding assembly is adapted to transfer the lens module to a testing position of the inspection device.