The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2014

Filed:

Jul. 21, 2012
Applicants:

Michael Minneman, Lafayette, CO (US);

Michael Crawford, Lafayette, CO (US);

Inventors:

Michael Minneman, Lafayette, CO (US);

Michael Crawford, Lafayette, CO (US);

Assignee:

Insight Photonic Solutions, Inc., Lafayette, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/31 (2006.01); G01N 21/33 (2006.01);
U.S. Cl.
CPC ...
G01N 21/314 (2013.01); G01N 21/33 (2013.01);
Abstract

A method and a system for characterization of optical components through characterized decomposition of an optical device includes: directing incident light over a range of wavelengths to a device under test, wherein the incident light includes a primary signal and at least one sideband signal, the distance between the primary signal and any one of the sideband signals is substantially larger than the width of the band pass area of the device under test; detecting output light from the device under test to obtain a detected signal; correcting the detected signal to account errors associated with the sideband signal.


Find Patent Forward Citations

Loading…