The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Jun. 10, 2010
Bernd Spruck, Moegglingen, DE;
Frank Hoeller, Aalen, DE;
Cristina Alvarez Diez, Aalen, DE;
Carl Zeiss AG, Oberkochen, DE;
Abstract
An evaluation device for path length measurement configured to evaluate a measured signal representing an intensity of a sequence of pulses of electromagnetic radiation, particularly a sequence of light pulses, as a function of time, after the sequence has traveled through a path length to be measured. The sequence of light pulses is generated with a repetition rate by a radiation source, particularly a light source. The evaluation device is configured to evaluate a first component of the measured signal, which oscillates with a first frequency, and a second component of the measured signal, which the second component oscillates with a second frequency that is greater than the first frequency. The first frequency may correspond to the repetition rate or a multiple of the repetition rate. The second frequency may correspond to another multiple of the repetition rate.