The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Aug. 16, 2011
Applicants:
Tai-hung Chen, New Taipei, TW;
Yi-wen Tsai, New Taipei, TW;
Yijian Lee, Taipei, TW;
Inventors:
Assignee:
Ability Enterprise, Co., Ltd., Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); G03B 7/00 (2014.01); H04N 5/238 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention is directed to a light sensitivity calibration method and an imaging device. An exposure step is performed to obtain a light sensitivity according to a predetermined time. A time adjustment step is performed to adjust the predetermined time according to the light sensitivity, thereby obtaining an adjusted time. The predetermined time is replaced with the adjusted time and the exposure and time adjustment steps are repeatedly performed, until the adjusted time converges within a predetermined range.