The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Mar. 31, 2010
Robert W. Byren, Manhattan Beach, CA (US);
Robert W. Byren, Manhattan Beach, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
A system for generating an image of contoured surface includes a light source that is configured to project an electromagnetic radiation beam onto the contoured surface, wherein the projected beam generates first radiation reflected from a first portion of the contoured surface to form a speckle pattern, and second radiation reflected from a second portion of the contoured surface which is substantially uniform in intensity. The reflected first and second reflected radiation is received by an optical detector, and may be processed. The processing is configured to (1) generate a plurality of images from the first and second reflected radiation, with each image being generated using different coherence length electromagnetic radiation from the light source, and (2) generate a 3-D image of the contoured surface from the plurality of images. Methods for generating a 3-D image of a contoured surface are also disclosed.