The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Aug. 27, 2010
Etienne Eccles, Surrey, GB;
Ben White, Surrey, GB;
Geoff Thiel, Surrey, GB;
Jung Keun Ahn, Goyang-si, KR;
Etienne Eccles, Surrey, GB;
Ben White, Surrey, GB;
Geoff Thiel, Surrey, GB;
Jung Keun Ahn, Goyang-si, KR;
UDP Technology Ltd., Seoul, KR;
VCA Technology, Surrey, GB;
Abstract
The present invention provides an apparatus and method for camera parameter calibration which is capable of easily and simply setting physical and optical characteristic parameters of a camera in order to acquire information on actual measurement of an image provided through the camera with high accuracy. The camera parameter calibration apparatus and method has an advantage of correct image analysis that it is capable of increasing accuracy of information of measurement through an image only with an intuitive interface manipulation, without taking a time-consuming and incorrect actual measurement procedure, by determining parameters of the space model corresponding to the image by displaying a 3D space model corresponding to a real space of the image on the image and changing and adjusting visual point parameters such that the 3D space model matches the display image, and regarding the determined parameters of the space model as camera parameters of the image.