The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Sep. 13, 2012
James G. Owen, Bolton, MA (US);
Lynn M. Cherny, Framingham, MA (US);
Jenifer Tidwell, Arlington, MA (US);
Rong Chen, Vernon, CT (US);
James G. Owen, Bolton, MA (US);
Lynn M. Cherny, Framingham, MA (US);
Jenifer Tidwell, Arlington, MA (US);
Rong Chen, Vernon, CT (US);
The MathWorks, Inc., Natick, MA (US);
Abstract
A tool for viewing data in a software environment is disclosed. The data may be a multi-dimensional data set. The viewer tool provides various features for viewing and exploring the data set. The viewer tool may be coupled to a test environment that generates data from the tests of a unit under test (UUT). The data may be generated from one or more sequences of tests that can be divided into batches. The viewer tool may receive the data from the test environment and analyze the data to provide a user with useful information on the data. The viewer tool may display the data with the information so that the user can obtain the information on the data. In particular, the viewer tool may enable the user to understand the relationship between the measured test data and the various test conditions under which the test data has been measured.