The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Jul. 31, 2013
Google Inc., Mountain View, CA (US);
Clemenz Portmann, Los Altos, CA (US);
Shahriar Rabii, Palo Alto, CA (US);
Donald Charles Stark, Palo Alto, CA (US);
Google Inc., Mountain View, CA (US);
Abstract
A method and device for testing a digital-to-analog converter is provided. The method may include configuring a decoder to address an individual unit cell of a plurality of unit cells of a digital-to-analog converter. The configured decoder may select a particular unit cell of the plurality of unit cells for testing. The selected unit cell may have digital and analog circuitry. A bias current of the selected unit cell may be increased. The increased bias current of the selected unit cell may be greater during the testing than during normal operation. A test logic signal may be applied to the selected unit cell. In response to the test logic signal, an output signal may be output from the selected unit cell logic circuitry of the digital-to-analog converter. A device may include logic circuitry configured to select an individual unit cell for testing and a current generating circuitry.