The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Jun. 26, 2009
Andre Luis L. Vilas Boas, São Paulo, BR;
Fabio Duarte DE Martin, São Paulo, BR;
Alfredo Olmos, Austin, TX (US);
Andre Luis L. Vilas Boas, São Paulo, BR;
Fabio Duarte de Martin, São Paulo, BR;
Alfredo Olmos, Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
An integrated circuit probing structure () is provided for evaluating functional circuitry (), such as a slow slew-rate square wave signal from a low power circuit, where the probing structure includes two or more probe pads () for testing the functional circuitry which are formed to be electrically separate from one another, and a probe test circuit () connected to the functional circuitry () for conveying a signal from the functional circuitry to a probe needle () only when the probe needle () electrically connects the two or more probe pads ().