The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Oct. 21, 2008
Hisato Takehara, Kobe, JP;
Yuji Wakamiya, Kobe, JP;
Tomoyuki Nishida, Ashiya, JP;
Sysmex Corporation, Kobe, JP;
Abstract
Specimen analyzer includes a first holding section for holding a container; a first mechanism section for executing a first operation for the container on the first holding section; a second holding section for holding the container; a first transfer mechanism section for transferring the container from the first holding section to the second one; a second mechanism section for executing a second operation for the container on the second one; an error detector for detecting error in the first mechanism section; and an error controller for controlling the operation of the first holding section, the first and second operation so that the first operation and the transfer operation of the first holding section would be stopped while the second operation would be continued in case of the error in the first mechanism section. An abnormality control method of the analyzer and computer program product are also disclosed.