The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2014

Filed:

Dec. 06, 2011
Applicant:

Masaki Yamano, Suita, JP;

Inventor:

Masaki Yamano, Suita, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G01N 29/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ultrasonic probe for detecting a flaw by ultrasonic waves in a tubular test object includes a plurality of transducers arranged along an annular curved surface, wherein the annular curved surface is obtained by cutting a predetermined spheroid with two parallel planes facing to each other that do not pass through a center of the spheroid and do not sandwich the center of the spheroid, said two parallel planes being orthogonal to a rotational axis of the spheroid. A shape of said annular curved surface is determined so that when transducers appropriately selected from said plurality of transducers are caused to transmit and receive ultrasonic waves, respective internal refraction angles θκ of the ultrasonic waves are approximately equivalent regardless of propagation directions of the ultrasonic waves.


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