The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2014
Filed:
Jul. 30, 2010
Takumi Inoue, Fukuoka, JP;
Takumi Inoue, Fukuoka, JP;
Kyushu University, National University Corporation, Fukuoka-Shi, JP;
Abstract
Provided herein is a non-destructive testing method capable of diagnosing a condition of an object to be tested using a single-pulse ultrasonic wave signal. An attenuation waveform of the single-pulse ultrasonic wave signal received by a receiving sectionis wavelet transformed by a wavelet transform sectionto obtain an envelope line A(t) and a phase φ(t) of the attenuation waveform. A temporal change computing sectionapproximates the attenuation waveform by an approximation equation available for computation, using the envelope line A(t) and the phase φ(t) of the attenuation waveform inputted from the wavelet transform section, and obtains the temporal change of instantaneous frequency of the attenuation waveform. A diagnosing sectiondiagnoses a condition of the object to be tested, based on the temporal change of the instantaneous frequency computed by the temporal change computing section