The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2014

Filed:

Nov. 15, 2011
Applicants:

Jonathan Richard Young, Dundee, MI (US);

Ronald Alonzo Bowers, New Hudson, MI (US);

Justin Thomas Lenoir, Fenton, MI (US);

Inventors:

Jonathan Richard Young, Dundee, MI (US);

Ronald Alonzo Bowers, New Hudson, MI (US);

Justin Thomas Lenoir, Fenton, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An impact test fixture includes a rolling frame structure, a ballast attachment feature coupled to the rolling frame structure, a position-adjustable attachment assembly coupled to the rolling frame structure, and a specimen attachment member coupled to the position-adjustable attachment assembly. The specimen attachment member is adjustable in a vertical direction and a transverse direction relative to the rolling frame structure.


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