The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2014

Filed:

Jul. 10, 2013
Applicant:

Sensor Platforms, Inc., San Jose, CA (US);

Inventors:

Deborah Meduna, San Francisco, CA (US);

Tom Waite, El Sobrante, CA (US);

Dev Rajnarayan, Mountain View, CA (US);

Assignee:

Sensor Platforms, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21C 17/00 (2006.01); G06F 17/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A processing apparatus including one or more processors and memory receives sensor measurements generated by one or more sensors of one or more devices, pre-classifies the sensor measurements as belonging to one of a plurality of pre-classifications, and selects one or more feature types to extract from the sensor measurements based at least in part on the pre-classification of the sensor measurements. The processing apparatus also extracts features of the one or more selected feature types from the sensor measurements and determines a state of a respective device of the one or more devices in accordance with a classification of the sensor measurements determined based on the one or more features extracted from the sensor measurements.


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