The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Dec. 18, 2003
James M. Van Dyke, Austin, TX (US);
John S. Montrym, Cupertino, CA (US);
Michael B. Nagy, Agoura Hills, CA (US);
Sean J. Treichler, Mountain View, CA (US);
James M. Van Dyke, Austin, TX (US);
John S. Montrym, Cupertino, CA (US);
Michael B. Nagy, Agoura Hills, CA (US);
Sean J. Treichler, Mountain View, CA (US);
Nvidia Corporation, Santa Clara, CA (US);
Abstract
The present invention systems and methods facilitate increased die yields by flexibly changing the operational characteristics of functional components in an integrated circuit die. The present invention system and method enable integrated circuit chips with defective functional components to be salvaged. Defective functional components in the die are disabled in a manner that maintains the basic functionality of the chip. A chip is tested and a functional component configuration process is performed on the chip based upon results of the testing. If an indication of a defective functional component is received, the functional component is disabled. Workflow is diverted from disabled functional components to enabled functional components.