The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Mar. 20, 2012
Yong Ho Kim, Bucheon-si, KR;
Ki Hyoung Cho, Anyang-si, KR;
Yong Ho Kim, Bucheon-si, KR;
Ki Hyoung Cho, Anyang-si, KR;
LG Electronics Inc., Seoul, KR;
Abstract
A method of scanning neighboring base stations for measuring channel quality in a wireless communication system includes receiving information associated with at least one neighboring base station; transmitting a scanning request message including parameters related to a requested scan duration, a requested interleaving interval and a requested scan iteration; and receiving a scanning response message in response to the scanning request message, the scanning response message including parameters related to an allowed scan duration, an allowed interleaving interval, a scan report mode, and an allowed scan iteration, wherein the scan report mode, which indicates a channel quality measurement reporting method, is set to '00' when the scan report mode indicates no report, set to '01' when the scan report mode indicates a periodic report, and set to ‘10’ when the scan report mode indicates a event-triggered report.