The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
May. 02, 2012
Christian Volf Olgaard, Saratoga, CA (US);
Ruizu Wang, San Ramon, CA (US);
John Christopher Lukez, Morgan Hill, CA (US);
Guang Shi, San Jose, CA (US);
Christian Volf Olgaard, Saratoga, CA (US);
Ruizu Wang, San Ramon, CA (US);
John Christopher Lukez, Morgan Hill, CA (US);
Guang Shi, San Jose, CA (US);
Litepoint Corporation, Sunnyvale, CA (US);
Abstract
A system and method for testing multiple-input-multiple-output (MIMO) devices under test (DUTs) with multiple radio frequency (RF) signal testers. Each tester receives one or more RF signals from one or more of the DUTs, and the testers are mutually coupled in a ring such that successive ones receive a trigger input signal from an upstream tester and provide a trigger output signal to a downstream tester. Each tester is responsive to its input trigger signal and its one or more RF signals by providing its output trigger signal such that its output trigger signal has an asserted state initiated in response to an assertion of its input trigger signal and a transcending of a predetermined magnitude by at least one of the one or more RF signals.