The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Feb. 09, 2010
Ning Yao, Pittsburgh, PA (US);
Izzat Izzat, Plainsboro, NJ (US);
Tao Zhang, Plainsboro, NJ (US);
Dong-qing Zhang, Plainsboro, NJ (US);
Ning Yao, Pittsburgh, PA (US);
Izzat Izzat, Plainsboro, NJ (US);
Tao Zhang, Plainsboro, NJ (US);
Dong-Qing Zhang, Plainsboro, NJ (US);
Thomson Licensing, Issy les Moulineaux, FR;
Abstract
Various implementations relate to improving depth maps. This may be done, for example, by identifying bad depth values and modifying those values. The values may represent, for example, holes and/or noise. According to a general aspect, a segmentation is determined based on an intensity image. The intensity image is associated with a corresponding depth image that includes depth values for corresponding locations in the intensity image. The segmentation is applied to the depth image to segment the depth image into multiple regions. A depth value is modified in the depth image based on the segmentation. A two-stage iterative procedure may be used to improve the segmentation and then modify bad depth values in the improved segmentation, and iterating until a desired level of smoothness is achieved. Both stages may be based, for example, on average depth values in a segment.