The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2014

Filed:

Jan. 28, 2011
Applicants:

Joshua D. Levine, Chapel Hill, NC (US);

Robert A. Levine, Guilford, CT (US);

Stephen C. Wardlaw, Lyme, CT (US);

Craig Stout, Port Matilda, PA (US);

David A. Clipper, State College, PA (US);

Inventors:

Joshua D. Levine, Chapel Hill, NC (US);

Robert A. Levine, Guilford, CT (US);

Stephen C. Wardlaw, Lyme, CT (US);

Craig Stout, Port Matilda, PA (US);

David A. Clipper, State College, PA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for and method of analyzing hematologic samples deposited within a capillary tube is provided. The method includes the steps of: a) imaging a region of sample centrifuged within a capillary tube using a first analysis device, which region is defined by substantially all of the radial width and axial length of the sample residing within the internal cavity of the tube where the float resides after centrifugation, and producing signals representative of the image; b) communicating the signals representative of the image to a second analysis device independent of, and remotely located from, the first analysis device; c) processing the signals representative of the image using the second analysis device and producing analysis data based on the signals; and d) displaying the image of the region of the sample using the second analysis device.


Find Patent Forward Citations

Loading…