The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Dec. 06, 2013
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Tomoaki Kitagawa, Hyogo, JP;
Hiroshi Takemoto, Aichi, JP;
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Abstract
A flaw detection image analyzer () takes in an inspection procedure command stored in a flaw detection condition database (), takes in a flaw detection image signal corresponding to a flaw detection image indicated by the taken inspection procedure command from a database () for flaw detection image signal, and displays the flaw detection image based on the flaw detection image signal on a display (), with a display range and a contrast indicated by the inspection procedure command in an arrangement pattern of image indicated by the inspection procedure command. Consequently, optimum images can be displayed sequentially with optimum arrangement pattern, optimum display range and contrast according to a flaw to be inspected when a flaw is detected by observing an ultrasonic flaw detection image.