The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Aug. 19, 2010
Yushi Tsubota, Hitachi, JP;
Fumito Watanabe, Kashiwa, JP;
Hironori Ueki, Hachioji, JP;
Yasutaka Konno, Saitama, JP;
Shinichi Kojima, Hitachinaka, JP;
Atsuro Suzuki, Hitachi, JP;
Yushi Tsubota, Hitachi, JP;
Fumito Watanabe, Kashiwa, JP;
Hironori Ueki, Hachioji, JP;
Yasutaka Konno, Saitama, JP;
Shinichi Kojima, Hitachinaka, JP;
Atsuro Suzuki, Hitachi, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
Scattered X-rays scattered by an object or a structure enter in a detector (a shift detector) for detecting the positional shift of an X-ray focal point and become a noise source, thereby deteriorating the positional shift detection precision. In particular, the estimation of the dose of scattered X-rays originating from the object is difficult prior to the measurement, and correction of the scattered X-rays is important in order to precisely calculate the positional shift of the X-ray focal point. In order to address this drawback, according to the present invention, a scattered X-ray detectoris provided which measures the dose of scattered rays entering in a shift detectorfor detecting the positional shift of an X-ray focal point, and has a function that the output by the shift detectoris corrected using the scattered ray dose measured by the scattered X-ray detector.