The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Oct. 13, 2010
Alexander A. Smith, Marietta, GA (US);
Vagish Madrahalli, Woodstock, GA (US);
Richard W. Conklin, Gainesville, GA (US);
Alexander A. Smith, Marietta, GA (US);
Vagish Madrahalli, Woodstock, GA (US);
Richard W. Conklin, Gainesville, GA (US);
Ciena Corporation, Linthicum, MD (US);
Abstract
The present disclosure provides systems and methods for making latency measurements and using these measurements in routing in optical networks. In an exemplary embodiment, a method is defined whereby two nodes sharing a line automatically determine whether both nodes are capable of making a latency measurement and then which node will initiate and which node participates in making the latency measurement. In another exemplary embodiment, an on-demand latency measurement may be made between any two arbitrary nodes within a domain. Routing messages may be used to disseminate the latency of links via a signaling and routing protocol. Advantageously, the present invention provides measurement of latency and latency variation of customer circuits (i.e., SNCs) using an in-band, non-intrusive calculation with a high-degree of accuracy. Furthermore, the present invention may consider these calculations for circuit routing based on the latency and circuit acceptance based on maximum latency restrictions.