The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2014

Filed:

Jul. 16, 2012
Applicant:

Yuusuke Hirai, Saitama, JP;

Inventor:

Yuusuke Hirai, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 13/00 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image pickup system includes: an optical system including a focus lens unit; a camera platform apparatus driving the optical system to pan and tilt; a measuring unit measuring a distance to an object, the measuring unit operable to be driven independently from the pan/tilt-driving of the optical system; and a controller storing panning/tilting positions of the optical system as pre-set positions, and controls driving of the optical system to the pre-set positions, wherein upon input of a drive command for driving the optical system to the stored pre-set positions, the controller drives the measuring unit so that a panning position of the measuring unit and the stored panning position correspond to each other and starts measurement by the measuring unit before completion of the driving of the optical system to the stored panning/tilting positions.


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Hirai, Yuusuke. (2014). Image pickup system, including measuring unit (U.S. Patent No. 8773576). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8773576

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