The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
May. 23, 2011
Chien-ping Wang, Yunlin County, TW;
Shih-chun Yang, Kaohsiung, TW;
Tzung-te Chen, Taipei, TW;
An-tse Lee, Hsinchu County, TW;
Sheng-bang Huang, Changhua County, TW;
Chien-Ping Wang, Yunlin County, TW;
Shih-Chun Yang, Kaohsiung, TW;
Tzung-Te Chen, Taipei, TW;
An-Tse Lee, Hsinchu County, TW;
Sheng-Bang Huang, Changhua County, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
An inspection system is provided, which applies a forward or reverse voltage on a light-emitting device and measures a current thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a current difference before and after the temperature rise is larger than a failure current determination value. Alternatively, the inspection system adopts a current applying device to apply a forward and reverse current on a light-emitting device and measures a voltage difference thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a difference of the voltage differences before and after the temperature rise is larger than a failure voltage determination value. Alternatively, the inspection system adopts a predetermined inspecting step and a rapid inspecting step respectively to determine whether a light-emitting device fails. An inspection method for the inspection system is also provided.