The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
May. 03, 2012
Jeong Hee Moon, Goyang-si, KR;
Dae Won Moon, Daejeon, KR;
Tae Geol Lee, Daejeon, KR;
Sohee Yoon, Guri-si, KR;
Ju Hwang Kim, Daejeon, KR;
Jeong Hee Moon, Goyang-si, KR;
Dae Won Moon, Daejeon, KR;
Tae Geol Lee, Daejeon, KR;
Sohee Yoon, Guri-si, KR;
Ju Hwang Kim, Daejeon, KR;
Abstract
The present invention aims to provide a time-of-flight based mass microscope system for an ultra-high speed multi-mode mass analysis, for using a laser beam or an ion beam simultaneously to enable both a low molecular weight analysis such as for drugs/metabolome/lipids/peptides and a high molecular weight analysis such as for genes/proteins, without being limited by the molecular weight of the object being analyzed, and for significantly increasing the measuring speed by using a microscope method instead of a microprobe method.