The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Dec. 02, 2011
Michael Hee, Burlingame, CA (US);
Jay Wei, Fremont, CA (US);
David Huang, Portland, OR (US);
Qienyuan Zhou, Del Mar, CA (US);
Yonghua Zhao, Pleasanton, CA (US);
Ben Jang, Cupertino, CA (US);
Tony Ko, Cupertino, CA (US);
Michael Hee, Burlingame, CA (US);
Jay Wei, Fremont, CA (US);
David Huang, Portland, OR (US);
Qienyuan Zhou, Del Mar, CA (US);
Yonghua Zhao, Pleasanton, CA (US);
Ben Jang, Cupertino, CA (US);
Tony Ko, Cupertino, CA (US);
Optovue, Inc., Fremont, CA (US);
Abstract
In accordance with some embodiments, a method of eye examination includes acquiring OCT data with a scan pattern centered on an eye cornea that includes n radial scans repeated r times, c circular scans repeated r times, and n* raster scans where the scan pattern is repeated m times, where each scan includes a A-scans, and where n is an integer that is 0 or greater, r is an integer that is 1 or greater, c is an integer that is 0 or greater, n* is an integer that is 0 or greater, m is an integer that is 1 or greater, and a is an integer greater than 1, the values of n, r, c, n*, and m being chosen to provide OCT data for a target measurement, and processing the OCT data to obtain the target measurement.