The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Oct. 14, 2011
Charles E. Beyer, Rochester, MI (US);
James M. Dwornick, Brownstown, MI (US);
Murthy Kowsika, Troy, MI (US);
R. Elliott Crews, Ypsilanti, MI (US);
David T. Chuey, Brownstown, MI (US);
Charles E. Beyer, Rochester, MI (US);
James M. Dwornick, Brownstown, MI (US);
Murthy Kowsika, Troy, MI (US);
R. Elliott Crews, Ypsilanti, MI (US);
David T. Chuey, Brownstown, MI (US);
Chrysler Group LLC, Auburn Hills, MI (US);
Abstract
In at least one implementation, a method for determining the stiffness of a structure may include connecting a test member to the structure, directing a beam of light at a measurement surface carried by at least one of the test member or the structure, impacting an impact surface carried by the test member with a known impact force, and determining the movement of the measurement surface that is caused by the impact. The movement of the measurement surface may be determined as a function of changes in the length of the beam of light and the stiffness of the structure may be a function of the magnitude of the measurement surface movement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile