The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Mar. 18, 2010
Applicant:
Jae-hoon Jeong, Yongin-si, KR;
Inventor:
Jae-hoon Jeong, Yongin-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3644 (2013.01);
Abstract
A dynamic instrumentation method and apparatus which may trace, debug, and profile the execution of a running program without affecting the operation of the program, are provided. According to the method, a break instruction is inserted and executed at start of execution of a first instruction and immediately after execution of the last instruction of a function constituting the program. Environment values of the function before and after execution may be identified. The program may be dynamically instrumented without being affected by any tracing or debugging operations.