The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Oct. 15, 2012
Applicant:

At&t Intellectual Property I, Lp, Atlanta, GA (US);

Inventor:

Steven Phillips, New York, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Certain exemplary embodiments can provide a method that can include, via a special purpose processor, automatically determining an unbiased estimate of a distribution from occurrence data having an occurrence data sample selection bias substantially equivalent to a background data sample selection bias, the occurrence data related to background data, the background data chosen with the background data sample selection bias, the occurrence data representing a physically-measurable variable of one or more physical and tangible objects or substances.


Find Patent Forward Citations

Phillips, Steven. (2014). Systems, devices, and/or methods for managing sample selection bias (U.S. Patent No. 8769094). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8769094

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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