The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Dec. 11, 2002
Applicants:

Antoine Pesme, Montigny-les-Metz, FR;

Daniel Mafille, Metz, FR;

Jamal Baïna, Nancy, FR;

Inventors:

Antoine Pesme, Montigny-les-Metz, FR;

Daniel Mafille, Metz, FR;

Jamal Baïna, Nancy, FR;

Assignee:

TDF, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

The metrological device, for example for a broadcasting network, for monitoring an upline broadcast signal includes a main component and upline control data. The metrological device includes an extraction circuit for extracting the upline control data from the upline broadcast signal and delivering an upline instruction, and a measuring circuit for measuring a parameter of the upline broadcast signal according to the upline instruction and delivering a measurement result. A control circuit produces a downline instruction from the measurement results and an upline result produced by the extraction circuit from the upline control data, and an insertion circuit produces a downline signal to broadcast comprising firstly the main component of the upline broadcast signal and secondly the downline control data containing the downline instruction.


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