The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Jul. 31, 2009
Hiroyuki Araki, Kanagawa, JP;
Tatsuya Shiobara, Tokyo, JP;
Chieko Watanabe, Tokyo, JP;
Nobuaki Matsubara, Saitama, JP;
Kazuhiro Akiyama, Tokyo, JP;
Hidenori Tsuruma, Tokyo, KP;
Tasuku Ogawa, Saitama, JP;
Hiroyuki Araki, Kanagawa, JP;
Tatsuya Shiobara, Tokyo, JP;
Chieko Watanabe, Tokyo, JP;
Nobuaki Matsubara, Saitama, JP;
Kazuhiro Akiyama, Tokyo, JP;
Hidenori Tsuruma, Tokyo, KP;
Tasuku Ogawa, Saitama, JP;
Olympus Medical Systems Corp., Tokyo, JP;
Abstract
The examination schedule memory unit stores an examination schedule including the starting time and the ending time of each examination. A cleaning capacity memory unit stores cleaning-capacity information that specifies the cleaning capacity of cleaning apparatuses that clean a scope used for the examination. A cleaning schedule generation unit generates a cleaning schedule for cleaning a used scope produced at the end of each examination with cleaning apparatuses having a cleaning capacity required by the cleaning-capacity information stored in the cleaning capacity memory unit. The scope shortage determination unit determines whether or not there will be a shortage of scopes to be used for each examination in accordance with both the examination starting time specified by the above examination schedule and the cleaning ending time specified by the cleaning schedule.