The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Mar. 09, 2012
Applicants:

Amir Shirkhodaie, Nashville, TN (US);

Kong MA, Carmel, IN (US);

Robert Moriarty, Greenwood, IN (US);

Inventors:

Amir Shirkhodaie, Nashville, TN (US);

Kong Ma, Carmel, IN (US);

Robert Moriarty, Greenwood, IN (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for inspecting surfaces including acquiring a surface image from a surface of a component; providing an image registration for the surface image; inspecting the component in response to the image registration to produce an input data set; creating an output data set in response to the input data set utilizing a fuzzy logic algorithm; and identifying a surface feature in response to the surface image and the output data set where acquiring the surface image further includes generating a radiation media; directing the radiation media at the component; detecting a responding radiation media in response to the directed radiation media and the component; creating the surface image in response to detecting the responding radiation media; and adjusting the generation of the radiation media in response to the surface image and a standard image.


Find Patent Forward Citations

Loading…