The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Apr. 27, 2011
James Zhengshe Liu, Glenview, IL (US);
Paul Richard Granfors, Berkeley, CA (US);
Kenneth Scott Kump, Waukesha, WI (US);
Ping Xue, Pewaukee, WI (US);
Donald Fayette Langler, Brookfield, WI (US);
Brian John Kost, Waukesha, WI (US);
James Zhengshe Liu, Glenview, IL (US);
Paul Richard Granfors, Berkeley, CA (US);
Kenneth Scott Kump, Waukesha, WI (US);
Ping Xue, Pewaukee, WI (US);
Donald Fayette Langler, Brookfield, WI (US);
Brian John Kost, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for processing X-ray image data includes exposing a digital detector to X-ray radiation. The method also includes sampling data via the digital detector including X-ray image data and offset image data. The method further includes calculating an average offset image without prior knowledge of a total number of offset image frames sampled.