The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Feb. 03, 2011
Herbert Bruder, Höchstadt, DE;
Karl Stierstorfer, Erlangen, DE;
Herbert Bruder, Höchstadt, DE;
Karl Stierstorfer, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method is disclosed for reconstructing image data of an examination object from measurement data of a computed tomography system, the examination object having been irradiated simultaneously by a number of X-ray sources while the measurement data was being acquired so that different projections of the examination object associated with the number of X-ray sources were acquired simultaneously for each detector element. In at least one embodiment, different iteration images of the examination object are determined one after the other from the measurement data by way of an iterative algorithm, a computation operation being employed with the iterative algorithm, which is applied to the iteration images and takes the presence of the number of X-ray sources into account.