The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Sep. 08, 2010
Applicants:

Keisuke Korekado, Wako, JP;

Tomoyuki Kamiyama, Wako, JP;

Inventors:

Keisuke Korekado, Wako, JP;

Tomoyuki Kamiyama, Wako, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are a distance measuring apparatus which can measure the distance to an object with high accuracy, a distance measuring method, and a program. The distance measuring apparatus is provided with: a light source which emits light; an image pickup unit, which picks up an image of light which has been emitted from the light source and reflected by means of the object; an image distance data converting unit, which converts image data obtained by the image pickup performed by the image pickup unit into image distance data which indicates the distance to the object; an image pickup condition setting unit, which sets first image pickup conditions on the basis of the image distance data; and an image pickup control unit, which controls the light source and the image pickup unit and have an image of the object picked up under the first image pickup conditions.


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