The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Oct. 18, 2013
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Atsushi Hashimoto, Ashigarakami-gun, JP;

Takuji Tada, Ashigarakami-gun, JP;

Dai Murakoshi, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray imaging apparatus comprises a first grid, a second grid, and an X-ray image detector. The first grid passes X-rays emitted from an X-ray source and produces a first periodic pattern image. The second grid opposes the first grid. The second grid partly blocks the first periodic pattern image and produces a second periodic pattern image with moiré fringes. The X-ray image detector detects the second periodic pattern image and produces image data. The X-ray image detector has pixels arranged in two dimensions in X and Y directions. The M pixels arranged in the Y direction form one group. The group is shifted in the Y direction by the number of the pixels less than M each time. A phase of an intensity modulated signal, composed of pixel values of the pixels in the each shifted group, is calculated. Thereby a differential phase image is produced.


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