The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

May. 15, 2007
Applicants:

Tzenka Miteva, Stuttgart, DE;

Piotr Minkin, Stuttgart, DE;

Gabriele Nelles, Stuttgart, DE;

Akio Yasuda, Stuttgart, DE;

Inventors:

Tzenka Miteva, Stuttgart, DE;

Piotr Minkin, Stuttgart, DE;

Gabriele Nelles, Stuttgart, DE;

Akio Yasuda, Stuttgart, DE;

Assignee:

Sony Deutschland GmbH, Berlin, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope measurement system including: an optical microscope including a microscope body and an objective connected to the microscope body; a chamber including a support mechanism holding an object to be examined therein, the chamber including an opening inserting the objective into the chamber such that the objective is located essentially within the chamber and the microscope body is located essentially outside of the chamber; a sealing mechanism that provides an essentially gas-tight connection between the optical microscope and the chamber such that the chamber is sealed.


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