The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Feb. 09, 2010
Applicants:

Jonathan B. Hunter, Marion, NY (US);

Andrew James Bonacci, Webster, NY (US);

David Mark Kerxhalli, Rochester, NY (US);

Brian R. Conrow, Webster, NY (US);

Michael J. Martin, Hamlin, NY (US);

Inventors:

Jonathan B. Hunter, Marion, NY (US);

Andrew James Bonacci, Webster, NY (US);

David Mark Kerxhalli, Rochester, NY (US);

Brian R. Conrow, Webster, NY (US);

Michael J. Martin, Hamlin, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of calibrating a printing system for positioning at least one printed image, the printing system includes a first image bearing surface, the method includes: a) forming a background pattern and at least three fiducials on the first image bearing surface, wherein the background pattern is larger than a first printed image and the at least three fiducials are within an area formed by the first printed image; b) transferring a portion of the first printed image to a second image bearing surface; c) measuring a first residual image on the first image bearing surface, wherein the first residual image is a portion of the background pattern and the at least three fiducials remaining on the first image bearing surface after the step of transferring; and, d) calculating at least one calibration parameter for the printing system based on the measuring of the first residual image.


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