The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Dec. 02, 2009
Carsten Glasenapp, Oberkochen, DE;
Carsten Glasenapp, Oberkochen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
An optical arrangement for the non-contact measurement or testing of properties of a solid's surface, such as curvature, shape, contour, roughness or alignment. An optical arrangement includes structure for establishing a gap between the solid's surface and a reference edge, structure for imaging the gap on a detector, and an analyzing system connected to the detector. The analyzing system is designed to determine gap widths lying adjacent to each other on the basis of the output signals of the detector, and to determine curvature, shape, contour or roughness of the solid's surface on the basis of the gap widths lying adjacent to each other. From the comparison of the images obtained from any two positions within a drilled hole, deductions can be made, among other things, about any tilt between the measuring object and the measuring system.