The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Jun. 11, 2012
Applicants:

Toshiro Kimura, Kyoto, JP;

Hiroyuki Yoshimura, Kusatsu, JP;

Inventors:

Toshiro Kimura, Kyoto, JP;

Hiroyuki Yoshimura, Kusatsu, JP;

Assignee:

Shimadzu Corporation, Kyoto-Shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01); G01J 3/08 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/08 (2013.01); G01J 3/027 (2013.01); G01J 3/42 (2013.01);
Abstract

A spectrophotometerincludes built-in detectorand external detector. When a mountable/removable optical path switcheris installed in a specimen chamber, measurement based on detection signals from built-in detectoris replaced by measurement based on detection signals from external detector. The spectrophotometer further includes a measurement data threshold-value storage unitthat stores threshold value T for measurement data from built-in detectoror external detector, and a light-receiving detector recognition unitthat recognizes which detector is able to receive the measuring light beam based on the results of a comparison between threshold value T and measurement data from built-in detectoror external detectorwhile the measuring light beam is being introduced into specimen chamber


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