The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Jun. 18, 2012
David J. Chen, Endwell, NY (US);
William F. Lawson, Vestal, NY (US);
David J. Chen, Endwell, NY (US);
William F. Lawson, Vestal, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and circuit for implementing calibration of a linearly weighted, thermal coded I/O driver output stage, and a design structure on which the subject circuit resides are provided. The circuit includes a PFET calibration impedance matching function determining calibration PVTP bits for calibrating output stage PFETs of the linearly weighted, thermal coded I/O driver output stage, an NFET calibration impedance matching function determining calibration bits PVTN for calibrating output stage NFETs of the linearly weighted, thermal coded I/O driver output stage once the PFET calibration is complete and an output latch function providing the calibration PVTP and PVTN outputs for the I/O driver output stage to match an impedance of an external calibration resistor. A clock logic function generates an output latch clock and an internal reset signal completing calibration.