The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2014

Filed:

Nov. 04, 2009
Applicants:

Lloyd Hollenberg, Carlton, AU;

Jared Cole, Carlton, AU;

Inventors:

Lloyd Hollenberg, Carlton, AU;

Jared Cole, Carlton, AU;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/20 (2006.01); G01R 33/32 (2006.01); G01Q 70/14 (2010.01); G01N 24/10 (2006.01); G01Q 60/00 (2010.01); B82Y 15/00 (2011.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
G01Q 70/14 (2013.01); B82Y 15/00 (2013.01); G01R 33/326 (2013.01); B82Y 35/00 (2013.01); G01N 24/10 (2013.01); G01Q 60/00 (2013.01);
Abstract

The present disclosure provides a method of monitoring a property of a sample, such as a nanoscopic property of the sample. The method comprises the steps of providing a quantum probe having a quantum state and exposing the quantum probe to the sample in a manner such that the property of the sample, in the proximity of the quantum probe, affects quantum coherence of the quantum probe. The method also comprises detecting a rate of quantum decoherence of the quantum probe to monitor the property of the sample. Further the present disclosure provides an apparatus for monitoring a property of a sample.


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