The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2014
Filed:
Dec. 21, 2010
Applicants:
David G. Grier, New York, NY (US);
KE Xiao, Elmhurst, NY (US);
Inventors:
David G. Grier, New York, NY (US);
Ke Xiao, Elmhurst, NY (US);
Assignee:
New York University, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/63 (2006.01); G01N 35/08 (2006.01); H01J 40/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system for controlled fractionation of particles. A sample having a plurality of particles of different size distributions. A uniform array for the preparing of optical traps having a selected array lattice constant. The plurality of particles for inputting the plurality of particles to the uniform array of optical traps at a driving direction angle Θ and the plurality of particles separating along different directions Θbased on variable particle attributes.